Introduction
Program, verify, Erase, burn procedures, blank check, one-time device check
Method
Programmer
Standard
Datasheet
Apply to
PROM, EPROM,EEPROM,FLASH,MCU

Introduction
Program, verify, Erase, burn procedures, blank check, one-time device check
Method
Programmer
Standard
Datasheet
Apply to
PROM, EPROM,EEPROM,FLASH,MCU

Introduction The device is baked at high temperature and vacuum-packed according to the requirements of humidity sensitivity level Method Put... read more
Introduction Test the electrical performance parameters of components in non-working state, including pin open circuit test, pin short... read more
Introduction Without damaging the chip, detect the packaging of components, such as bubbles, abnormal bond line, die size,... read more
Introduction Test the ability of the device to withstand high temperature, low temperature, cold and hot shock environment Method Constant... read more
Introduction Verify the high frequency characteristics of microwave chip according to specifications Method In the laboratory simulate chip the real... read more
Introduction Verify the functions of components according to specifications Method In the laboratory simulate chip the real working state, lap... read more
Introduction Verify the parameters of IGBT according to the specification Method To build IGBT drive circuit, special high-power drive circuit... read more
Introduction Check whether the marking, main body and leads of components meet the standard Method Microscope Standard AS6081, AS9120 Apply to Suspect that the... read more
